
After finishing their studies, most PhD-students soon become managers. Often they get this type of job without much training in how to do it. This course gives a concentrated guide on the best way to manage a small industrial unit or research group. The specific focus will be on the management of R&D organisations. |
Scanning Probe Microscopy (SPM) is a family of cutting-edge techniques which are a cornerstone tool in nanotechnology that is widely used for the nanoscale characterization,measurement and modification or fabrication of nanostructures. Besides obtaining true 3-dimensional reconstruction of the morphology of the surfaces, a wide variety of physical properties can be imaged across the surface, like electronic, magnetic, mechanical and viscoelastic properties, distribution of electrical charge and potential. In this course we will cover the theory of tip-sample interactions, design of scanners and probes, introduction to static AFM modes including force-distance curves, contact mode imaging, set point and error signals, and friction force imaging, introduction to dynamic AFM modes – including AC mode imaging, phase contrast imaging, effects of frequ ency tuning, dynamic–force distance curves and basics of electronic, magnetic and electrostatic force imaging, mapping of surface potential, characterization of local mechanical and viscoelastic properties and nanoindentation. |

Director and Contact: Prof. Rolf Sandström